32 citations · 118 across the 8 of their papers we have counts for
5 papers · 1 filter
Formation of buried conductive micro-channels in single crystal diamond with MeV C and He implantation
F. Picollo, P. Olivero, F. Bellotti +6
As demonstrated in previous works, implantation with a MeV ion microbeam through masks with graded thickness allows the formation of conductive micro-channels in diamond which are…
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…
Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode
P. Olivero, J. Forneris, P. Gamarra +6
The transport properties of a 4H-SiC Schottky diode have been investigated by the Ion Beam Induced Charge (IBIC) technique in lateral geometry through the analysis of the charge co…
Charge collection efficiency mapping of interdigitated 4H-SiC detectors
E. Vittone, N. Skukan, Z. Pastuovic +2
The Ion Beam Induced Charge Collection (IBIC) technique was used to map the charge collection efficiency (CCE) of a 4H-SiC photodetector with coplanar interdigitated Schottky barri…
Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes
P. Olivero, J. Forneris, M. Jaksic +4
This paper reports on the fabrication and characterization of a high purity monocrystalline diamond detector with buried electrodes realized by the selective damage induced by a fo…