32 citations · 118 across the 8 of their papers we have counts for
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4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy
Ettore Vittone, Paolo Olivero, Milko Jaksic +1
We report findings on the Ion Beam Induced Charge (IBIC) characterization of a 4H-SiC Schottky barrier diode (SBD), in terms of the modification of the Charge Collection Efficiency…
Increased Phase Coherence Length in a Porous Topological Insulator
Alex Nguyen, Golrokh Akhgar, David L. Cortie +11
The surface area of Bi2Te3 thin films was increased by introducing nanoscale porosity. Temperature dependent resistivity and magnetotransport measurements were conducted both on as…
Fluorine-based color centers in diamond
S. Ditalia Tchernij, T. Lühmann, E. Corte +14
We report on the creation and characterization of the luminescence properties of high-purity diamond substrates upon F ion implantation and subsequent thermal annealing. Their room…
Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
E. Vittone, Z. Pastuovic, P. Olivero +5
The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…