57 citations · 540 across the 25 of their papers we have counts for
6 papers · 2 filters
Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode
P. Olivero, J. Forneris, P. Gamarra +6
The transport properties of a 4H-SiC Schottky diode have been investigated by the Ion Beam Induced Charge (IBIC) technique in lateral geometry through the analysis of the charge co…
IBIC analysis of CdTe/CdS solar cells
E. Colombo, A. Bosio, S. Calusi +8
This paper reports on the investigation of the electronic properties of a thin film CdS/CdTe solar cell with the Ion Beam Induced Charge (IBIC) technique. The device under test is…
Charge collection efficiency mapping of interdigitated 4H-SiC detectors
E. Vittone, N. Skukan, Z. Pastuovic +2
The Ion Beam Induced Charge Collection (IBIC) technique was used to map the charge collection efficiency (CCE) of a 4H-SiC photodetector with coplanar interdigitated Schottky barri…
Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes
P. Olivero, J. Forneris, M. Jaksic +4
This paper reports on the fabrication and characterization of a high purity monocrystalline diamond detector with buried electrodes realized by the selective damage induced by a fo…
Lateral IBIC characterization of single crystal synthetic diamond detectors
A. Lo Giudice, P. Olivero, C. Manfredotti +9
In order to evaluate the charge collection efficiency (CCE) profile of single-crystal diamond devices based on a p type/intrinsic/metal configuration, a lateral Ion Beam Induced Ch…
IBIC characterization of an ion-beam-micromachined multi-electrode diamond detector
J. Forneris, V. Grilj, M. Jaksic +7
Deep Ion Beam Lithography (DIBL) has been used for the direct writing of buried graphitic regions in monocrystalline diamond with micrometric resolution. Aiming at the development…