activity
20122022
most citedSystematic study of defect-related quenching of NV luminescence in diamond with time correlated single photon counting spectroscopy

57 citations · 540 across the 25 of their papers we have counts for

collaborators
Showing 2016Show all

14 papers · 1 filter

cond-mat.mes-hall2016★ 22 cited

Formation of buried conductive micro-channels in single crystal diamond with MeV C and He implantation

F. Picollo, P. Olivero, F. Bellotti +6

As demonstrated in previous works, implantation with a MeV ion microbeam through masks with graded thickness allows the formation of conductive micro-channels in diamond which are…

cond-mat.mtrl-sci2016★ 30 cited

Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy

E. Vittone, Z. Pastuovic, P. Olivero +5

The acronym IBIC (Ion Beam Induced Charge) was coined in early 1990's to indicate a scanning microscopy technique which uses MeV ion beams as probes to image the basic electronic p…

cond-mat.mtrl-sci2016★ 38 cited

Finite element analysis of ion-implanted diamond surface swelling

F. Bosia, P. Olivero, E. Vittone +10

We present experimental results and numerical Finite Element analysis to describe surface swelling due to the creation of buried graphite-like inclusions in diamond substrates subj…

physics.ins-det2016★ 6 cited

Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode

P. Olivero, J. Forneris, P. Gamarra +6

The transport properties of a 4H-SiC Schottky diode have been investigated by the Ion Beam Induced Charge (IBIC) technique in lateral geometry through the analysis of the charge co…

physics.ins-det2016★ 23 cited

IBIC analysis of CdTe/CdS solar cells

E. Colombo, A. Bosio, S. Calusi +8

This paper reports on the investigation of the electronic properties of a thin film CdS/CdTe solar cell with the Ion Beam Induced Charge (IBIC) technique. The device under test is…

physics.ins-det2016★ 8 cited

Charge collection efficiency mapping of interdigitated 4H-SiC detectors

E. Vittone, N. Skukan, Z. Pastuovic +2

The Ion Beam Induced Charge Collection (IBIC) technique was used to map the charge collection efficiency (CCE) of a 4H-SiC photodetector with coplanar interdigitated Schottky barri…

cond-mat.mtrl-sci2016★ 41 cited

Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization

P. Olivero, G. Amato, F. Bellotti +10

We report on a novel method for the fabrication of three-dimensional buried graphitic micropaths in single crystal diamond with the employment of focused MeV ions. The use of impla…

cond-mat.mtrl-sci2016★ 20 cited

Direct fabrication and IV characterization of sub-surface conductive channels in diamond with MeV ion implantation

P. Olivero, G. Amato, F. Bellotti +4

In the present work we report about the investigation of the conduction mechanism of sp2 carbon micro-channels buried in single crystal diamond. The structures are fabricated with…

cond-mat.mtrl-sci2016★ 29 cited

Controlled variation of the refractive index in ion-damaged diamond

P. Olivero, S. Calusi, L. Giuntini +6

A fine control of the variation of the refractive index as a function of structural damage is essential in the fabrication of diamond-based optical and photonic devices. We report…

physics.ins-det2016★ 32 cited

Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes

P. Olivero, J. Forneris, M. Jaksic +4

This paper reports on the fabrication and characterization of a high purity monocrystalline diamond detector with buried electrodes realized by the selective damage induced by a fo…

physics.ins-det2016★ 10 cited

Lateral IBIC characterization of single crystal synthetic diamond detectors

A. Lo Giudice, P. Olivero, C. Manfredotti +9

In order to evaluate the charge collection efficiency (CCE) profile of single-crystal diamond devices based on a p type/intrinsic/metal configuration, a lateral Ion Beam Induced Ch…

physics.ins-det2016★ 23 cited

IBIC characterization of an ion-beam-micromachined multi-electrode diamond detector

J. Forneris, V. Grilj, M. Jaksic +7

Deep Ion Beam Lithography (DIBL) has been used for the direct writing of buried graphitic regions in monocrystalline diamond with micrometric resolution. Aiming at the development…

cond-mat.mtrl-sci2016★ 33 cited

Modification of the structure of diamond with MeV ion implantation

F. Bosia, N. Argiolas, M. Bazzan +5

We present experimental results and numerical simulations to investigate the modification of structural-mechanical properties of ion-implanted single-crystal diamond. A phenomenolo…

cond-mat.mtrl-sci2016★ 5 cited

Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

E. Bernardi, A. Battiato, P. Olivero +2

In this work, we present an investigation by Kelvin Probe Microscopy (KPM) of buried graphitic microchannels fabricated in single-crystal diamond by direct MeV ion microbeam writin…