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20202024
most citedBenchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization

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cond-mat.mtrl-sci2020

Towards twin-free molecular beam epitaxy of 2D chalcogenides explained by stronger interlayer van der Waals coupling

Wouter Mortelmans, Karel De Smet, Ruishen Meng +4

Defect-free epitaxial growth of 2D materials is one of the holy grails for a successful integration of van der Waals (vdW) materials in the semiconductor industry. The large-area (…