Measurement of the transmission secondary electron yield of nanometer-thick films in a prototype Timed Photon Counter

T. H. A. van der Reep, B. Looman, H. W. Chan +2

We measure the transmission secondary electron yield of nanometer-thick Al${}_2$O${}_3$/TiN/Al${}_2$O${}_3$ films using a prototype version of a Timed Photon Counter (TiPC). We discuss the…