activity
20202025
most citedGenL: An extensible fitting program for Laue oscillations and whole pattern fitting

4 citations · 11 across the 8 of their papers we have counts for

collaborators

8 papers

physics.ins-det2025

Quantitative measurement of magnetic dichroic signals at sub-nanometer to atomic scale resolution conditions

Sharath Kumar Manjeshwar Sathyanath, Anna L. Ravensburg, Vassilios Kapaklis +3

When aiming for atomic resolution electron magnetic circular dichroism (EMCD) in STEM mode, the high convergence angle of the electron probe can lead to unforeseen artefacts and st…

cond-mat.mtrl-sci2025★ 1 cited

Using Thermodynamics and Microstructure to Mitigate Overfitting in Pellet Reduction Models

Ömer K. Büyükuslu, Fabrice Yang, Dierk Raabe +2

Direct reduction of iron using hydrogen-rich gas is rapidly emerging as a key strategy for green steel production. This process involves complex, multiscale phenomena, encompassing…

cond-mat.mtrl-sci2024★ 1 cited

Boundary-induced phase in epitaxial iron layers

Anna L. Ravensburg, Mirosław Werwiński, Justyna Rychły-Gruszecka +9

We report the discovery of a boundary-induced body-centered tetragonal (bct) iron phase in thin films deposited on MgAlO () substrates. We present evidence for thi…

physics.app-ph2024

Terahertz emission from -W/CoFe epitaxial spintronic emitters

Venkatesh Mottamchetty, Rimantas Brucas, Anna L. Ravensburg +8

We report efficient terahertz (THz) generation in epitaxial -W/CoFe spintronic emitters. Two types of emitters have been investigated; epitaxial -W/Co$_{…

cond-mat.mtrl-sci2024★ 3 cited

The effect of iron layer thickness on the interlayer exchange coupling in Fe/MgO (001) superlattices

Anna L. Ravensburg, Matías P. Grassi, Björgvin Hjövarsson +1

We describe the effect of the Fe layer thickness on the antiferromagnetic interlayer exchange coupling in [Fe/MgO] superlattices. An increase in coupling strength with increasi…

cond-mat.mtrl-sci2023★ 4 cited

GenL: An extensible fitting program for Laue oscillations and whole pattern fitting

Anna L. Ravensburg, Johan Bylin, Vassilios Kapaklis +1

GenL is a flexible program that can be used to simulate and/or fit X-ray reflectivity and X-ray diffraction data from epitaxial thin films exhibiting, for example, Laue oscillation…