33 citations · 33 across the 4 of their papers we have counts for
5 papers
Nanometer-scale operando electric field mapping in oxide junctions by correlative STEM-EBIC and 4D-STEM
Yining Xie, Eoin Moynihan, Xingyao Li +5
Understanding local electric fields at oxide interfaces is essential for linking interfacial electrostatics to device functionality, yet conventional electrical measurements infer…
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan +4
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or bea…
Template masks for 4D-STEM
Yining Xie, Eoin Moynihan, Marin Alexe +3
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each poin…
TopoTEM: A Python Package for Quantifying and Visualising Scanning Transmission Electron Microscopy Data of Polar Topologies
Eoghan OConnell, Kalani Moore, Elora McFall +4
The exotic internal structure of polar topologies in multi-ferroic materials offers a rich landscape for materials science research. As the spatial scale of these entities are ofte…
Plasmons in MoS2 Studied via Experimental and Theoretical Correlation of Energy Loss Spectra
Eoin Moynihan, Stefan Rost, Eoghan O'Connell +3
Two dimensional materials offer a path forward for smaller and more efficient devices. Their optical and electronic properties give way to beat the limits set in place by Moore's L…