2 papers
cond-mat.mtrl-sci2021
Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures
N. A. Sanford, P. T. Blanchard, M. D. Brubaker +6
Laser-assisted atom probe tomography (APT) was used to measure the indium mole fraction x of c-plane, MOCVD-grown, GaN/In(x)Ga(1-x)N/GaN test structures and the results were compar…
cond-mat.supr-con2018
Enhanced Superconducting Transition Temperature in Electroplated Rhenium
David P. Pappas, Donald E. David, Russell E. Lake +13
We show that electroplated Re films in multilayers with noble metals such as Cu, Au, and Pd have an enhanced superconducting critical temperature relative to previous methods of pr…