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20192026
most citedA Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks

27 citations · 38 across the 6 of their papers we have counts for

collaborators

6 papers

cs.CV2026

On the Transfer of Collinearity to Computer Vision

Frederik Beuth, Danny Kowerko

Collinearity is a visual perception phenomenon in the human brain that amplifies spatially aligned edges arranged along a straight line. However, it is vague for which purpose huma…

cs.CV2024★ 1 cited

Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects

Zhining Hu, Tobias Schlosser, Michael Friedrich +3

In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural net…

eess.IV2022★ 8 cited

Visual Acuity Prediction on Real-Life Patient Data Using a Machine Learning Based Multistage System

Tobias Schlosser, Frederik Beuth, Trixy Meyer +5

In ophthalmology, intravitreal operative medication therapy (IVOM) is a widespread treatment for diseases related to the age-related macular degeneration (AMD), the diabetic macula…

cs.CV2021

Improving Automated Visual Fault Detection by Combining a Biologically Plausible Model of Visual Attention with Deep Learning

Frederik Beuth, Tobias Schlosser, Michael Friedrich +1

It is a long-term goal to transfer biological processing principles as well as the power of human recognition into machine vision and engineering systems. One of such principles is…

cs.CV2021★ 2 cited

Biologically Inspired Hexagonal Deep Learning for Hexagonal Image Generation

Tobias Schlosser, Frederik Beuth, Danny Kowerko

Whereas conventional state-of-the-art image processing systems of recording and output devices almost exclusively utilize square arranged methods, biological models, however, sugge…

cs.LG2019★ 27 cited

A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks

Tobias Schlosser, Frederik Beuth, Michael Friedrich +1

Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible…