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cs.LG2022
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Tianshu Hou, Peining Zhen, Ngai Wong +4
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…
eess.SP2022
A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing
Tianshu Hou, Ngai Wong, Quan Chen +2
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling. Tr…