4 citations · 4 across the 3 of their papers we have counts for
3 papers
cs.LG2022
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Tianshu Hou, Peining Zhen, Ngai Wong +4
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…
eess.SP2022
A Space-Time Neural Network for Analysis of Stress Evolution under DC Current Stressing
Tianshu Hou, Ngai Wong, Quan Chen +2
The electromigration (EM)-induced reliability issues in very large scale integration (VLSI) circuits have attracted increased attention due to the continuous technology scaling. Tr…
cs.CV2021★ 4 cited
FAT: Learning Low-Bitwidth Parametric Representation via Frequency-Aware Transformation
Chaofan Tao, Rui Lin, Quan Chen +3
Learning convolutional neural networks (CNNs) with low bitwidth is challenging because performance may drop significantly after quantization. Prior arts often discretize the networ…