activity
19992026
most citedImaging of Microwave Permittivity, Tunability, and Damage Recovery in (Ba,Sr)TiO3 Thin Films

90 citations · 224 across the 6 of their papers we have counts for

collaborators

6 papers

physics.optics2026

Microwave noise downconversion in interband cascade laser frequency combs

Grzegorz Gomółka, Florian Pilat, Benedikt Schwarz +6

Chip-scale semiconductor laser frequency combs offer remarkable prospects for compact and power-efficient optical sensors. For the laser to be suitable for typical comb application…

physics.optics2021★ 14 cited

Cavity-Enhanced Vernier Spectroscopy with a Chip-Scale Mid-Infrared Frequency Comb

Lukasz A. Sterczewski, Tzu-Ling Chen, Douglas C. Ober +7

Chip-scale optical frequency combs can provide broadband spectroscopy for diagnosing complex organic molecules. They are also promising as miniaturized laser spectrometers in appli…

physics.ins-det2018★ 1 cited

Mid-infrared dual-comb spectroscopy with low drive-power on-chip sources

Lukasz A. Sterczewski, Jonas Westberg, Mahmood Bagheri +9

Two semiconductor optical frequency combs consuming less than 1 W of electrical power are used to demonstrate high-sensitivity mid-infrared dual-comb spectroscopy in the important…

physics.ins-det2017★ 41 cited

Multiheterodyne spectroscopy using interband cascade lasers

Lukasz A. Sterczewski, Jonas Westberg, Charles Link Patrick +8

While mid-infrared radiation can be used to identify and quantify numerous chemical species, contemporary broadband mid-IR spectroscopic systems are often hindered by large footpri…

cond-mat.mtrl-sci2000★ 78 cited

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood +5

We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 mic…

cond-mat.mtrl-sci1999★ 90 cited

Imaging of Microwave Permittivity, Tunability, and Damage Recovery in (Ba,Sr)TiO3 Thin Films

D. E. Steinhauer, C. P. Vlahacos, C. Canedy +5

We describe the use of a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectric samples on a length sca…