9 citations · 9 across the 1 of their papers we have counts for
3 papers
physics.ins-det2022★ 9 cited
Response of a Commercial 0.25 um Thin-Film Silicon-on-Sapphire CMOS Technology to Total Ionizing Dose
Michael P. King, Datao Gong, Chonghan Liu +7
The radiation response of a 0.25 um silicon-on-sapphire CMOS technology is characterized at the transistor and circuit levels utilizing both standard and enclosed layout devices. D…
physics.app-ph2019
Proton-Irradiation-Immune Electronics Implemented with Two-Dimensional Charge-Density-Wave Devices
A. Geremew, F. Kargar, E. X. Zhang +8
Proton radiation damage is an important failure mechanism for electronic devices in near-Earth orbits, deep space and high energy physics facilities. Protons can cause ionizing dam…
physics.ins-det2018
State-of-the-Art Flash Chips for Dosimetry Applications
Preeti Kumari, Levi Davies, Narayana P. Bhat +4
In this paper we show that state-of-the-art commercial off-the-shelf Flash memory chip technology (20 nm technology node with multi-level cells) is quite sensitive to ionizing radi…