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20192026
most citedReduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination

12 citations · 13 across the 4 of their papers we have counts for

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physics.data-an2023

Continuous-Time Modeling and Analysis of Particle Beam Metrology

Akshay Agarwal, Minxu Peng, Vivek K. Goyal

Particle beam microscopy (PBM) performs nanoscale imaging by pixelwise capture of scalar values representing noisy measurements of the response from secondary electrons (SEs) integ…