25 citations · 61 across the 11 of their papers we have counts for
12 papers
Ozone Cues Mitigate Reflected Downwelling Radiance in LWIR Absorption-Based Ranging
Unay Dorken Gallastegi, Wentao Shangguan, Vaibhav Choudhary +4
Passive long-wave infrared (LWIR) absorption-based ranging relies on atmospheric absorption to estimate distances to objects from their emitted thermal radiation. First demonstrate…
Beam Cross Sections Create Mixtures: Improving Feature Localization in Secondary Electron Imaging
Vaibhav Choudhary, Akshay Agarwal, Vivek K Goyal
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of…
Free-running vs. Synchronous: Single-Photon Lidar for High-flux 3D Imaging
Ruangrawee Kitichotkul, Shashwath Bharadwaj, Joshua Rapp +3
Conventional wisdom suggests that single-photon lidar (SPL) should operate in low-light conditions to minimize dead-time effects. Many methods have been developed to mitigate these…
Image Reconstruction from Readout-Multiplexed Single-Photon Detector Arrays
Shashwath Bharadwaj, Ruangrawee Kitichotkul, Akshay Agarwal +1
Readout multiplexing is a promising solution to overcome hardware limitations and data bottlenecks in imaging with single-photon detectors. Conventional multiplexed readout process…
Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Akshay Agarwal, Leila Kasaei, Xinglin He +6
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam…
Absorption-Based, Passive Range Imaging from Hyperspectral Thermal Measurements
Unay Dorken Gallastegi, Hoover Rueda-Chacon, Martin J. Stevens +1
Passive hyperspectral longwave infrared measurements are remarkably informative about the surroundings. Remote object material and temperature determine the spectrum of thermal rad…
Continuous-Time Modeling and Analysis of Particle Beam Metrology
Akshay Agarwal, Minxu Peng, Vivek K. Goyal
Particle beam microscopy (PBM) performs nanoscale imaging by pixelwise capture of scalar values representing noisy measurements of the response from secondary electrons (SEs) integ…
Non-Line-of-Sight Tracking and Mapping with an Active Corner Camera
Sheila Seidel, Hoover Rueda-Chacon, Iris Cusini +4
The ability to form non-line-of-sight (NLOS) images of changing scenes could be transformative in a variety of fields, including search and rescue, autonomous vehicle navigation, a…
Denoising Particle Beam Micrographs with Plug-and-Play Methods
Minxu Peng, Ruangrawee Kitichotkul, Sheila W. Seidel +2
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed…
Online Beam Current Estimation in Particle Beam Microscopy
Sheila W. Seidel, Luisa Watkins, Minxu Peng +3
In conventional particle beam microscopy, knowledge of the beam current is essential for accurate micrograph formation and sample milling. This generally necessitates offline calib…
Secondary Electron Count Imaging in SEM
Akshay Agarwal, John Simonaitis, Vivek K. Goyal +1
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity o…
Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination
Akshay Agarwal, Karl K. Berggren, Vivek Goyal
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic…