95 citations · 115 across the 8 of their papers we have counts for
8 papers
Reversible Modulation of Thermal Conductivity in GaN through Strain-Field Screening around Dislocations
Shantal Adajian, Fanghao Zhang, Andrew Christison +9
Crystalline defects are generally regarded as static phonon scatterers that irreversibly suppress thermal transport. Here we show that elastic strain can reversibly modify dislocat…
Micromechanics reveal strain rate dependent transition between dislocation mechanisms in a dual phase high entropy alloy
Szilvia Kalácska, Amit Sharma, Rajaprakash Ramachandramoorthy +8
An equimolar NiCoFeCrGa high entropy alloy having dual-phase homogeneous components was studied, where the constituent phases exhibit distinct mechanical properties. Micropillars w…
Strain rate sensitivity of a Cu/AlO multi-layered thin film
Szilvia Kalácska, László Pethő, Guillaume Kermouche +2
To study the size and strain rate dependency of copper polycrystalline microstructures, a multi-layered copper/AlO thin film was deposited on a Si substrate using a hybrid…
Fabrication and extreme micromechanics of additive metal microarchitectures
Sung-Gyu Kang, Barbara Bellon, Lalithkumar Bhaskar +14
The mechanical performance of metallic metamaterials with 3-dimensional solid frames is typically a combination of the geometrical effect ("architecture") and the characteristic si…
Irreversible evolution of dislocation pile-ups during cyclic microcantilever bending
Dávid Ugi, Kolja Zoller, Kolos Lukács +5
In metals geometrically necessary dislocations (GNDs) are generated primarily to accommodate strain gradients and they play a key role in the Bauschinger effect, strain hardening,…
Dislocation Avalanches: Earthquakes on the Micron Scale
Péter Dusán Ispánovity, Dávid Ugi, Gábor Péterffy +7
Compression experiments on micron-scale specimens and acoustic emission (AE) measurements on bulk samples revealed that the dislocation motion resembles a stick-slip process - a se…
In situ atomic force microscopy depth-corrected 3-dimensional focused ion beam based time-of-flight secondary ion mass spectroscopy: spatial resolution, surface roughness, oxidation
Lex Pillatsch, Szilvia Kalácska, Xavier Maeder +1
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining s…
The effect of δ-hydride on the micromechanical deformation of Zircaloy-4 studied by in situ high angular resolution electron backscatter diffraction
Siyang Wang, Szilvia Kalácska, Xavier Maeder +3
Zircaloy-4 is used extensively as nuclear fuel cladding materials and hydride embrittlement is a major failure mechanism. To explore the effect of δ-hydride on plastic deformation…