activity
19992020
most citedLevel spectrum and charge relaxation in a silicon double quantum dot probed by dual-gate reflectometry

21 citations · 55 across the 9 of their papers we have counts for

collaborators

9 papers

cond-mat.soft2020★ 1 cited

Dielectric permittivity of deeply supercooled water according to the measurement data at the frequencies 7.6 GHz and 9.7 GHz

G. S. Bordonskiy, A. A. Gurulev, A. O. Orlov

Dielectric permittivity of supercooled volume water has been measured in the range of temperatures from C to C at the frequencies ~GHz and ~…

cond-mat.soft2019

Loss Factor of Supercooled Water at the Frequencies of 11...180 GHz

G. S. Bordonskiy, A. O. Orlov

The loss factor of supercooled water at the frequencies 11...180 GHz has been measured. A measuring technique has been proposed, in which wetted nanoporous silicate materials, sili…

cond-mat.mes-hall2016★ 21 cited

Level spectrum and charge relaxation in a silicon double quantum dot probed by dual-gate reflectometry

Alessandro Crippa, Romain Maurand, Dharmraj Kotekar-Patil +10

We report on dual-gate reflectometry in a metal-oxide-semiconductor double-gate silicon transistor operating at low temperature as a double quantum dot device. The reflectometry se…

cond-mat.mes-hall2015

Experimental Demonstration of Single Electron Transistors Featuring SiO2 PEALD in Ni-SiO2-Ni Tunnel Junctions

Golnaz Karbasian, Michael S. McConnell, Alexei O. Orlov +2

We report the use of plasma-enhanced atomic layer deposition (PEALD) to fabricate single-electron transistors (SETs) featuring ultra-thin (~1 nm) tunnel-transparent SiO2 in Ni-SiO2…

cond-mat.soft2013★ 1 cited

Electric properties of supercooled water contained in cylindrical nanopores

G. S. Bordonskiy, A. O. Orlov

The paper provides data on measuring electrical properties of supercooled water in nanoporous silica MCM-41 with 3.5 nm diameter cylindrical pores, using the methods of dielectric…

cond-mat.soft2012

Study of wet mesostructure silica MCM-41 by low frequency dielectric spectroscopy

G. S. Bordonskiy, A. A. Gurulev, A. O. Orlov +1

The dielectric measurements of mesostructured silica MCM-41 with the pore diameter 3.5 nm at wettings close to maximal were carried out. The measurements were made by using the die…