6 citations · 10 across the 6 of their papers we have counts for
6 papers
Interface-Assisted Room-Temperature Magnetoresistance in Cu-Phenalenyl-based Magnetic Tunnel Junctions
Neha Jha, Anand Paryar, Tahereh Sadat Parvini +8
Delocalized carbon-based radical species with unpaired spin, such as phenalenyl (PLY) radical, opened avenues for developing multifunctional organic spintronic devices. Here we dev…
Microstructural analysis of GaN films grown on (1 0 0) MgF substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry
Tobias Niemeyer, Kevin Meyer, Christoph Flathmann +3
The use of highly efficient and solarblind GaN photocathodes as part of multichannel plate UV detectors for applications in astronomy would strongly benefit from the direct growth…
Tracing boron diffusion into a textured silicon solar cell using electron beam induced current in a scanning transmission electron microscope
Tobias Meyer, David A. Ehrlich, Peter Pichler +7
The light absorption of [001] grown single-crystalline silicon wafers can be enhanced by chemical etching, e.g., with potassium hydroxide, resulting in a pyramid-like surface textu…
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view
Tobias Meyer, Tobias Westphal, Birte Kressdorf +3
Transmission electron microscopy has become a major characterisation tool with an ever increasing variety of methods being applied in wide range of scientific fields. However, the…
Phase transitions in a perovskite thin film studied by environmental in-situ heating nano-beam electron diffraction
Tobias Meyer, Birte Kressdorf, Vladimir Roddatis +3
The rich phase diagram of bulk PrCaMnO resulting in a high tunability of physical properties gave rise to various studies related to fundamental research as well…
Plasma Profiling Time-of-Flight Mass Spectrometry for Fast Elemental Analysis of Semiconductor Structures with Depth Resolution in the Nanometer Range
Hendrik Spende, Christoph Margenfeld, Tobias Meyer +6
Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolut…