35 citations · 73 across the 5 of their papers we have counts for
1 paper · 2 filters
Måns J. Mattsson, Kham M. Niang, Jared Parker +4
The complete subgap defect density of states (DoS) is measured using the ultrabroadband (0.15 to 3.5 eV) photoconduction response from p-type thin-film transistors (TFTs) of tin ox…