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M. Valtr

2 papers hereh-index 14586 citations62 works total

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author position
  • middle author1
  • last author1

Across the 2 of 2 papers where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall1
  • physics.data-an1

identity via Semantic Scholar / OpenAlex

most citedAb initio study of angle-resolved electron reflection spectroscopy of few-layer graphene

2 citations · 2 across the 1 of their papers we have counts for

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Showing physics.data-anShow all

1 paper · 1 filter

physics.data-an2020

Estimation of roughness measurement bias originating from background subtraction

David Nečas, Petr Klapetek, Miroslav Valtr

When measuring the roughness of rough surfaces, the limited sizes of scanned areas lead to its systematic underestimation. Levelling by polynomials and other filtering used in real…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.