2 citations · 2 across the 1 of their papers we have counts for
2 papers
cond-mat.mes-hall2025★ 2 cited
Ab initio study of angle-resolved electron reflection spectroscopy of few-layer graphene
Aleš Paták, Martin Zouhar, Ivo Konvalina +8
We present ab initio theory for electron reflection spectroscopy of few-layer graphene for arbitrary angles of incidence. The inelastic effects are included in a consistent way usi…
physics.data-an2020
Estimation of roughness measurement bias originating from background subtraction
David Nečas, Petr Klapetek, Miroslav Valtr
When measuring the roughness of rough surfaces, the limited sizes of scanned areas lead to its systematic underestimation. Levelling by polynomials and other filtering used in real…