30 citations · 39 across the 5 of their papers we have counts for
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cond-mat.mtrl-sci2010★ 30 cited
Logarithmic behavior of degradation dynamics in metal--oxide semiconductor devices
Roberto da Silva, Gilson I. Wirth
In this paper the authors describe a theoretical simple statistical modelling of relaxation process in metal-oxide semiconductor devices that governs its degradation. Basically, st…
cond-mat.stat-mech2010★ 9 cited
A novel and precise time domain description of MOSFET low frequency noise due to random telegraph signals
Roberto da Silva, Gilson Wirth, Lucas Brusamarello
Nowadays, random telegraph signals play an important role in integrated circuit performance variability, leading for instance to failures in memory circuits. This problem is relate…