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physics.app-ph2022
Estimating time constants of the RTS noise in semiconductor devices: a complete description of the observation window in the time domain
Roberto da Silva, Gilson Wirth
We obtained a semi-analytical treatment obtaining estimators for the sample variance and variance of sample variance for the RTS noise. Our method suggests a way to experimentally…
physics.app-ph2020
Threshold Voltage Jitter due to Random Telegraph Noise
Gilson Wirth
With the downscaling of MOSFETs to nanometer dimensions, transistor electrical parameter variability is produced by factors other than variations of physical dimensions and doping…