847 citations · 1.7k across the 17 of their papers we have counts for
Showing cond-mat.mtrl-sciShow all
2 papers · 1 filter
cond-mat.mtrl-sci2020★ 6 cited
Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy
J. Schaab, K. Shapovalov, P. Schoenherr +10
Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining…
cond-mat.mtrl-sci2014★ 29 cited
Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
J. Schaab, I. P. Krug, F. Nickel +9
High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application…