27 citations · 32 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2020★ 5 cited
Robust multi-scale multi-feature deep learning for atomic and defect identification in Scanning Tunneling Microscopy on H-Si(100) 2x1 surface
Maxim Ziatdinov, Udi Fuchs, James H. G. Owen +2
The nature of the atomic defects on the hydrogen passivated Si (100) surface is analyzed using deep learning and scanning tunneling microscopy (STM). A robust deep learning framewo…
cond-mat.mtrl-sci2002★ 27 cited
Structure of Bi nanolines: using tight-binding to search parameter space
D. R. Bowler, J. H. G. Owen
We describe how we have used tight binding calculations as a quick, efficient tool to search for possible structures of Bi nanolines on Si(001). After identifying promising candida…