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20132024
most citedCombining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer

2 citations · 2 across the 2 of their papers we have counts for

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math.NA2013

Convergence of Parareal for the Navier-Stokes equations depending on the Reynolds number

Johannes Steiner, Daniel Ruprecht, Robert Speck +1

The paper presents first a linear stability analysis for the time-parallel Parareal method, using an IMEX Euler as coarse and a Runge-Kutta-3 method as fine propagator, confirming…