2 citations · 2 across the 2 of their papers we have counts for
3 papers
Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer
Binh Duong Nguyen, Johannes Steiner, Peter Wellmann +1
Detecting and analyzing various defect types in semiconductor materials is an important prerequisite for understanding the underlying mechanisms as well as tailoring the production…
GivEn -- Shape Optimization for Gas Turbines in Volatile Energy Networks
Jan Backhaus, Matthias Bolten, Onur Tanil Doganay +19
This paper describes the project GivEn that develops a novel multicriteria optimization process for gas turbine blades and vanes using modern "adjoint" shape optimization algorithm…
Convergence of Parareal for the Navier-Stokes equations depending on the Reynolds number
Johannes Steiner, Daniel Ruprecht, Robert Speck +1
The paper presents first a linear stability analysis for the time-parallel Parareal method, using an IMEX Euler as coarse and a Runge-Kutta-3 method as fine propagator, confirming…