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20192023
most citedEvent driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications

99 citations · 139 across the 4 of their papers we have counts for

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cond-mat.mtrl-sci2021★ 1 cited

Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings

Abner Velazco, Daen Jannis, Armand Béché +1

The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtain…