activity
20192023
most citedEvent driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications

99 citations · 139 across the 4 of their papers we have counts for

collaborators

5 papers

physics.ins-det2023★ 27 cited

Quantum Wavefront Shaping with a 48-element Programmable Phase Plate for Electrons

Chu-Ping Yu, Francisco Vega Ibáñez, Armand Béché +1

We present a 48-element programmable phase plate for coherent electron waves produced by a combination of photolithography and focused ion beam. This brings the highly successful c…

physics.ins-det2021★ 99 cited

Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications

Daen Jannis, Christoph Hofer, Chuang Gao +4

Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substant…

cond-mat.mtrl-sci2021★ 1 cited

Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings

Abner Velazco, Daen Jannis, Armand Béché +1

The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtain…

physics.app-ph2020

Evaluation of different rectangular scan strategies for STEM imaging

Abner Velazco, Magnus Nord, Armand Béché +1

STEM imaging is typically performed by raster scanning a focused electron probe over a sample. Here we investigate and compare three different scan patterns, making use of a progra…

physics.app-ph2019★ 12 cited

Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique

Viveksharma Prabhakara, Daen Jannis, Armand Béché +2

Moiré fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another referen…