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physics.app-ph2026
Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl
Tamazouzt Chennit, Arno Annys, Songge Li +3
Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be…
physics.app-ph2025
Improving the low-dose performance of aberration correction in single sideband ptychography
Songge Li, Nicolas Gauquelin, Hoelen L. Lalandec Robert +5
The single sideband (SSB) framework of analytical electron ptychography can account for the presence of residual geometrical aberrations induced by the probe-forming lens. However,…