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cs.AR2021★ 1 cited
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process
Michihiro Shintani, Riaz-Ul-Haque Mian, Tomoki Nakamura +3
Wafer-level performance prediction has been attracting attention to reduce measurement costs without compromising test quality in production tests. Although several efficient metho…
cs.AR2020
Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem
Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue
Software-hardware co-design solutions for decimal computation can provide several Pareto points to development of embedded systems in terms of hardware cost and performance. This p…