activity
20202025
most citedWafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process

1 citations · 1 across the 4 of their papers we have counts for

collaborators

5 papers

cs.DC2025

Accelerating HDC-CNN Hybrid Models Using Custom Instructions on RISC-V GPUs

Wakuto Matsumi, Riaz-Ul-Haque Mian

Machine learning based on neural networks has advanced rapidly, but the high energy consumption required for training and inference remains a major challenge. Hyperdimensional Comp…

cs.LG2025

Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning

Wang WeiQuan, Riaz-ul-Haque Mian

In semiconductor manufacturing, testing costs remain significantly high, especially during wafer and FPGA testing. To reduce the number of required tests while maintaining predicti…

cs.HC2025

Approach to Visual Attractiveness of Event Space Through Data-Driven Environment and Spatial Perception

Aliffi Majiid, Riaz-Ul-Haque Mian, Kouki Kurohara +1

Revitalizing Japan's remote areas has become a crucial task, and Matsue City exemplifies this effort in its temporary event spaces, created through collective efforts to foster urb…

cs.AR2021★ 1 cited

Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process

Michihiro Shintani, Riaz-Ul-Haque Mian, Tomoki Nakamura +3

Wafer-level performance prediction has been attracting attention to reduce measurement costs without compromising test quality in production tests. Although several efficient metho…

cs.AR2020

Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal Computation in RISC-V Ecosystem

Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue

Software-hardware co-design solutions for decimal computation can provide several Pareto points to development of embedded systems in terms of hardware cost and performance. This p…