Evidence of Charge Multiplication in Thin $25\mu \mathrm{m}\times 25\mu \mathrm{m}$ Pitch 3D Silicon Sensors

Andrew Gentry, Maurizio Boscardin, Martin Hoeferkamp +4

Characterization measurements of $25\mu \mathrm{m}\times 25\mu \mathrm{m}$ pitch 3D silicon sensors are performed, for devices with active thickness of $150\mu$m. Evidence of charge mu…