activity
20092024
most citedRadiation resistant LGAD design

133 citations · 634 across the 22 of their papers we have counts for

collaborators
Showing 2016Show all

6 papers · 1 filter

physics.ins-det2016★ 27 cited

First Production of New Thin 3D Sensors for HL-LHC at FBK

DMS Sultan, Gian-Franco Dalla Betta, Roberto Mendicino +3

Owing to their intrinsic (geometry dependent) radiation hardness, 3D pixel sensors are promising candidates for the innermost tracking layers of the forthcoming experiment upgrades…

physics.ins-det2016★ 26 cited

The INFN-FBK Phase-2 R{\&}D Program

Gian-Franco Dalla Betta, Maurizio Boscardin, Marco Bomben +12

We report on the 3-year INFN ATLAS-CMS joint research activity in collaboration with FBK, started in 2014, and aimed at the development of new thin pixel detectors for the High Lum…

physics.ins-det2016★ 55 cited

Development of a new generation of 3D pixel sensors for HL-LHC

Gian-Franco Dalla Betta, Maurizio Boscardin, Giovanni Darbo +6

This paper covers the main technological and design aspects relevant to the development of a new generation of thin 3D pixel sensors with small pixel size aimed at the High-Luminos…

physics.ins-det2016

Development of New 3D Pixel Sensors for Phase 2 Upgrades at LHC

Gian-Franco Dalla Betta, Maurizio Boscardin, Roberto Mendicino +3

We report on the development of new 3D pixel sensors for the Phase 2 Upgrades at the High-Luminosity LHC (HL-LHC). To cope with the requirements of increased pixel granularity (e.g…

physics.ins-det2016★ 53 cited

Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations

F. Moscatelli, D. Passeri, A. Morozzi +3

In this work we propose a new combined TCAD radiation damage modelling scheme, featuring both bulk and surface radiation damage effects, for the analysis of silicon detectors aimed…

physics.ins-det2016★ 7 cited

Measurements and TCAD Simulations of Bulk and Surface Radiation Damage Effects in Silicon Detectors

F. Moscatelli, P. Maccagnani, D. Passeri +7

In this work we propose the application of a radiation damage model based on the introduction of deep level traps/recombination centers suitable for device level numerical simulati…