most citedElectron diffraction based techniques in scanning electron microscopy of bulk materials

290 citations · 340 across the 4 of their papers we have counts for

collaborators

9 papers

cond-mat.mtrl-sci2020

Grain Boundary Serration in Nickel Alloy Inconel 600: Quantification and Mechanisms

Yuanbo T. Tang, Phani Karamched, Junliang Liu +3

The serration of grain boundaries in Inconel 600 caused by heat treatment is studied systematically. A new method based on Fourier transforms is used to analyse the multiple wave-l…

cond-mat.mtrl-sci2020

Tetragonality of Fe-C martensite -- a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction

Tomohito Tanaka, Naoki Maruyama, Nozomu Nakamura +1

Measurements of the local tetragonality in Fe-C martensite at microstructural length-scale through pattern matching of electron backscatter diffraction patterns (EBSPs) and careful…

physics.geo-ph2019

Dislocation interactions during low-temperature plasticity of olivine strengthen the lithospheric mantle

David Wallis, Lars. N. Hansen, Kathryn M. Kumamoto +12

The strength of the lithosphere is typically modelled based on constitutive equations for steady-state flow. However, models of lithospheric flexure reveal differences in lithosphe…

cond-mat.mtrl-sci2019

Low activation, refractory, high entropy alloys for nuclear applications

A Kareer, JC Waite, B Li +3

Two new, low activation high entropy alloys (HEAs) TiVZrTa and TiVCrTa are studied for use as in-core, structural nuclear materials for in-core nuclear applications. Low-activation…

cond-mat.mtrl-sci2019

Warren-Averbach line broadening analysis from a time of flight neutron diffractometer

David M. Collins, Angus J. Wilkinson, Richard I. Todd

The well known Warren-Averbach theory of diffraction line profile broadening is shown to be applicable to time of flight data obtained from a neutron spallation source. Without mod…

cond-mat.mtrl-sci2019

Pattern Matching Analysis of Electron Backscatter Diffraction Patterns for Pattern Centre, Crystal Orientation and Absolute Elastic Strain Determination: Accuracy and Precision Assessment

Tomohito Tanaka, Angus J. Wilkinson

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a…