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physics.ins-det2025
Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope
Yusuke Sakiyama, Emanuel Pfitzner, Santiago H. Andany +2
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nan…
physics.ins-det2023
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
Mustafa Kangül, Navid Asmari, Santiago H. Andany +2
Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high…
physics.ins-det2020
An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
Santiago H. Andany, Gregor Hlawacek, Stefan Hummel +3
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolutio…