5 papers
Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope
Yusuke Sakiyama, Emanuel Pfitzner, Santiago H. Andany +2
Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nan…
A hybrid polymer/ceramic/semiconductor fabrication platform for high-sensitivity fluid-compatible MEMS devices with sealed integrated electronics
Nahid Hosseini, Matthias Neuenschwander, Jonathan D. Adams +7
Active microelectromechanical systems can couple the nanomechanical domain with the electronic domain by integrating electronic sensing and actuation mechanisms into the micromecha…
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
Mustafa Kangül, Navid Asmari, Santiago H. Andany +2
Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high…
Engineering optically active defects in hexagonal boron nitride using focused ion beam and water
Evgenii Glushkov, Michal Macha, Esther Rath +11
Hexagonal boron nitride (hBN) has emerged as a promising material platform for nanophotonics and quantum sensing, hosting optically-active defects with exceptional properties such…
An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
Santiago H. Andany, Gregor Hlawacek, Stefan Hummel +3
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolutio…