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20162022
most citedMassively strained VO2 thin film growth on RuO2

21 citations · 33 across the 6 of their papers we have counts for

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cond-mat.mtrl-sci2022★ 4 cited

Low-energy electron microscopy intensity-voltage data -- factorization, sparse sampling, and classification

Francesco Masia, Wolfgang Langbein, Simon Fischer +2

Low-energy electron microscopy (LEEM) taken as intensity-voltage (I-V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are dif…