140 citations · 283 across the 14 of their papers we have counts for
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Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD
Dominik Graulich, Jan Krieft, Anastasiia Moskaltsova +8
X-ray resonant magnetic reflectivity (XRMR) allows for the simultaneous measurement of structural, optical and magnetooptic properties and depth profiles of a variety of thin film…
Beam damage of single semiconductor nanowires during X-ray nano beam diffraction experiments
Ali AlHassan, Jonas Lähnemann, Arman Davtyan +8
Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, wh…
Cation- and lattice-site-selective magnetic depth profiles of ultrathin (001) films
Tobias Pohlmann, Timo Kuschel, Jari Rodewald +7
A detailed understanding of ultrathin film surface properties is crucial for the proper interpretation of spectroscopic, catalytic and spin-transport data. We present x-ray magneti…
Spatially-resolved luminescence and crystal structure of single core-shell nanowires measured in the as-grown geometry
Ali AlHassan, Jonas Lähnemann, Steven Leake +9
We report on the direct correlation between the structural and optical properties of single, as-grown core-multi-shell GaAs/InGaAs/GaAs/AlAs/GaAs nanowires. Fabri…