29 citations · 29 across the 3 of their papers we have counts for
3 papers
In-situ Nanoscale Characterization of Composition and Structure during Formation of Ultrathin Nickel Silicide
Tuan T. Tran, Christian Lavoie, Zhen Zhang +1
We characterize composition and structure of ultrathin nickel silicide during formation from 3 nm Ni films on Si(100) using in-situ high resolution ion scattering and high resoluti…
In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering
Tuan Thien Tran, Lukas Jablonka, Christian Lavoie +2
We demonstrate a novel approach for non-destructive in-situ characterization of phase transitions of ultrathin nickel silicide films using 3D medium-energy ion scattering. The tech…
Electronic interaction of slow hydrogen and helium ions in the nickel-silicon system
Tuan Thien Tran, Lukas Jablonka, Barbara Bruckner +6
Electronic stopping cross sections (SCS) of nickel, silicon and nickel-silicon alloys for protons and helium (He) ions are studied in the regime of medium and low energy ion scatte…