40 citations · 255 across the 20 of their papers we have counts for
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Universal scaling relation for growth phenomena
Evandro A. Rodrigues, Edwin E. Mozo Luis, Thiago A. de Assis +1
The Family-Vicsek relation is a seminal universal relation obtained for the global roughness at the interface of two media in the growth process. In this work, we revisit the scali…
Bifractality in one-dimensional Wolf-Villain model
Edwin E. Mozo Luis, Silvio C. Ferreira, Thiago A. de Assis
We introduce a multifractal optimal detrended fluctuation analysis to study the scaling properties of the one-dimensional Wolf-Villain (WV) model for surface growth. This model pro…
Statistics of adatom diffusion in a model of thin film growth
Edwin E. Mozo Luis, Ismael S. S. Carrasco, Thiago A. de Assis +1
We study the statistics of the number of executed hops of adatoms at the surface of films grown with the Clarke-Vvedensky (CV) model in simple cubic lattices. The distributions of…
Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces
Edwin E. Mozo Luis, Thiago A. de Assis, Silvio C. Ferreira
We present an optimal detrended fluctuation analysis (DFA) and applied it to evaluate the local roughness exponent in non-equilibrium surface growth models with mounded morphology.…
Relaxation after a change in the interface growth dynamics
T. A. de Assis, F. D. A. Aarão Reis
The global effects of sudden changes in the interface growth dynamics are studied using models of the Edwards-Wilkinson (EW) and Kardar-Parisi-Zhang (KPZ) classes during their grow…
Thin film deposition with time varying temperature
T. A. de Assis, F. D. A. A. Reis
We study the effects of time-dependent substrate/film temperature in the deposition of a mesoscopically thick film using a statistical model that accounts for diffusion of adatoms…