2 papers
cs.LG2025
Detecting Defective Wafers Via Modular Networks
Yifeng Zhang, Bryan Baker, Shi Chen +4
The growing availability of sensors within semiconductor manufacturing processes makes it feasible to detect defective wafers with data-driven models. Without directly measuring th…
cs.CV2020
Saliency Prediction with External Knowledge
Yifeng Zhang, Ming Jiang, Qi Zhao
The last decades have seen great progress in saliency prediction, with the success of deep neural networks that are able to encode high-level semantics. Yet, while humans have the…