12 citations · 12 across the 4 of their papers we have counts for
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Secondary Electron Count Imaging in SEM
Akshay Agarwal, John Simonaitis, Vivek K. Goyal +1
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity o…
Image-Histogram-based Secondary Electron Counting to Evaluate Detective Quantum Efficiency in SEM
Akshay Agarwal, John Simonaitis, Karl K. Berggren
Scanning electron microscopy is a powerful tool for nanoscale imaging of organic and inorganic materials. An important metric for characterizing the limits of performance of these…
Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination
Akshay Agarwal, Karl K. Berggren, Vivek Goyal
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic…