Hidden Defect Chemistry in Ion-Irradiated MoS${}_2$ Field-Effect Transistors Revealed by Photocurrent Loss

L. Daniel, D. Sutarma, L. Klieve +7

Defect engineering in monolayer MoS${}_2$ is a promising route to tune field-effect transistors (FETs), but the electronic response of defects in processed devices can be masked by c…