17 citations · 89 across the 31 of their papers we have counts for
5 papers · 1 filter
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda +15
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critic…
Challenges of Reliability Assessment and Enhancement in Autonomous Systems
Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan +1
The gigantic complexity and heterogeneity of today's advanced cyber-physical systems and systems of systems is multiplied by the use of avant-garde computing architectures to emplo…
High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin +2
Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of th…
Towards Multidimensional Verification: Where Functional Meets Non-Functional
Maksim Jenihhin, Xinhui Lai, Tara Ghasempouri +1
Trends in advanced electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems…
Mixed-level identification of fault redundancy in microprocessors
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin +2
A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is spec…