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20202024
most citedRapid Flow Behavior Modeling of Thermal Interface Materials Using Deep Neural Networks

1 citations · 1 across the 3 of their papers we have counts for

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cs.CV2024

Iterative Cluster Harvesting for Wafer Map Defect Patterns

Alina Pleli, Simon Baeuerle, Michel Janus +3

Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…

cs.CV2020

CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings

Simon Baeuerle, Jonas Barth, Elton Renato Tavares de Menezes +2

Electronic control units (ECUs) are essential for many automobile components, e.g. engine, anti-lock braking system (ABS), steering and airbags. For some products, the 3D pose of e…