1 citations · 1 across the 3 of their papers we have counts for
3 papers
Iterative Cluster Harvesting for Wafer Map Defect Patterns
Alina Pleli, Simon Baeuerle, Michel Janus +3
Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…
Rapid Flow Behavior Modeling of Thermal Interface Materials Using Deep Neural Networks
Simon Baeuerle, Marius Gebhardt, Jonas Barth +2
Thermal Interface Materials (TIMs) are widely used in electronic packaging. Increasing power density and limited assembly space pose high demands on thermal management. Large cooli…
CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings
Simon Baeuerle, Jonas Barth, Elton Renato Tavares de Menezes +2
Electronic control units (ECUs) are essential for many automobile components, e.g. engine, anti-lock braking system (ABS), steering and airbags. For some products, the 3D pose of e…