2 papers
cond-mat.stat-mech2025
Universal scaling relation for growth phenomena
Evandro A. Rodrigues, Edwin E. Mozo Luis, Thiago A. de Assis +1
The Family-Vicsek relation is a seminal universal relation obtained for the global roughness at the interface of two media in the growth process. In this work, we revisit the scali…
cond-mat.mes-hall2025
Universal scaling of electrostatic effects of a curved counter-electrode on the emitter field enhancement
Thiago A. de Assis, Fernando F. Dalll'Agnol
Experiments on field electron emission from single-tip nanoemitters have typically been carried out using a counter-electrode with a finite curvature radius , positioned at a di…