Universal scaling of electrostatic effects of a curved counter-electrode on the emitter field enhancement
arXiv:2501.12580 · doi:10.1063/5.0252449
Abstract
Experiments on field electron emission from single-tip nanoemitters have typically been carried out using a counter-electrode with a finite curvature radius , positioned at a distance from the emitter's apex. The effects of the counter-electrode's curvature on the apex field enhancement factor () of the emitter are still not understood. In this Letter, we theoretically explore how the apex field enhancement factor of an emitter, represented by a hemisphere on a cylindrical post (HCP) with apex radius nm, is influenced by the curvature of a spherical-shaped counter-electrode. Importantly, our results show that for HCPs with sharpness aspect ratios typically between and , there is a universal scaling such that , where represents the apex field enhancement factor for the emitter assuming a planar counter-electrode, and is a universal scaling function such that for and , with close to unity, for . These findings help partially explain discrepancies observed in orhtodox field electron emission experiments, who reported that the effective values extracted from the current-voltage characteristics of single-tip carbon nanotubes typically underestimate the theoretical values when , a trend that is predicted by our results.
arXiv commentThis is a revised version of our original Letter submitted to Applied Physics Letters on December 9, 2024. This revised version was resubmitted to Applied Physics Letters on January 20, 2025
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